Patents
DEVICE AND METHOD FOR MONITORING CRYSTALLIZATION
EP2 588 649 B1
US 9,284,659 B2
QUALIFICATION METHOD FOR CRYOELECTRON MICROSCOPY SAMPLES AND CORRESPONDING SAMPLE HOLDER
EP3 739 321 B1
US 11,609,171
EP2 588 649 B1
US 9,284,659 B2
EP3 739 321 B1
US 11,609,171